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Characterization Facilities  

1        Photoreflectance and Photoluminescence System
0.3m triple grating monochromator, xenon arc lamp, tungsten lamp, lock in amplifier, light chopper, Ge and Si detectors, and utilizes the low temperature (up to 4K) closed cycle sample chamber.

(more PR and PL Lab Pictures)

2        Bede Scientific X-Ray Diffraction System
A Bede 200/D³ high resolution x-ray diffractometer system with a resolution of 12 arc seconds; computer software controlled.

3        Hall Measurements Set Up

4        SQUID Magnetic System
Hall effect/resistivity, van der Pauw method, 8kG electromagnet, low temperature (12K) closed-cycle refrigerator

5        Leitz interference microscope for film thickness measurement.

6        LCR Meter for CV Measurement System
  two LCR meters, HP 4284A, 20 Hz to 1MHz.

7        A Philips x-ray diffractometer system with Cu-tube.

8    Bend Test System

9        Olympus BX60 and Nikon reflected light brightfield/darkfield and Nomarski phase contrast microscope

10        Tencor surface profiler (stylus).

11        Computer-controlled current-voltage and capacitance-voltage

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